Difference between revisions of "Atomic Force Microscope (Q1950)"
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(Created claim: part of dictionary (P11): ARIM Instrument Dictionary (Q1882)) |
(Changed claim: has broader (P8): Scanning Probe Microscope (Q1892)) |
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| Property / has broader | Property / has broader | ||
| - | + | ||
Revision as of 05:29, 9 December 2021
ARIM instrument classification
- AFM
| Language | Label | Description | Also known as |
|---|---|---|---|
| English |
Atomic Force Microscope
|
ARIM instrument classification
|
|