Difference between revisions of "Atomic Force Microscope (Q2138)"

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(‎Created a new Item: Item created by hirosawa)
 
 
(7 intermediate revisions by the same user not shown)
label / jalabel / ja
 +
原子間力顕微鏡
aliases / en / 0aliases / en / 0
 +
AFM
aliases / ja / 0aliases / ja / 0
 +
AFM
description / endescription / en
 +
DICE instrument classification
description / jadescription / ja
 +
DICE装置分類
Property / has broader
 +
Property / has broader: Scanning Probe Microscope / rank
 +
Normal rank
Property / part of dictionary
 +
Property / part of dictionary: DICE Instrument Dictionary / rank
 +
Normal rank
Property / similar to item
 +
Property / similar to item: Atomic Force Microscope / rank
 +
Normal rank

Latest revision as of 06:33, 6 April 2022

DICE instrument classification
  • AFM
Language Label Description Also known as
English
Atomic Force Microscope
DICE instrument classification
  • AFM

Statements