Difference between revisions of "Focused Ion Beam (Q2130)"
Jump to navigation
Jump to search
(Created a new Item: Item created by hirosawa) |
(Created claim: similar to item (P40): Focused Ion Beam (Q1944)) |
||
| (7 intermediate revisions by the same user not shown) | |||
| label / ja | label / ja | ||
| + | 集束イオンビーム | ||
| aliases / en / 0 | aliases / en / 0 | ||
| + | FIB | ||
| aliases / ja / 0 | aliases / ja / 0 | ||
| + | FIB | ||
| description / en | description / en | ||
| + | DICE instrument classification | ||
| description / ja | description / ja | ||
| + | DICE装置分類 | ||
| Property / has broader | |||
| + | |||
| Property / has broader: Sample Prepration / rank | |||
| + | Normal rank | ||
| Property / part of dictionary | |||
| + | |||
| Property / part of dictionary: DICE Instrument Dictionary / rank | |||
| + | Normal rank | ||
| Property / similar to item | |||
| + | |||
| Property / similar to item: Focused Ion Beam / rank | |||
| + | Normal rank | ||
Latest revision as of 05:19, 27 April 2022
DICE instrument classification
- FIB
| Language | Label | Description | Also known as |
|---|---|---|---|
| English |
Focused Ion Beam
|
DICE instrument classification
|
|