Difference between revisions of "Electronic Materials & Device characterization (Q2020)"
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(Changed an Item: Item created by hirosawa) |
(Created claim: similar to item (P40): Electronic Materials & Device characterization (Q2208)) |
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| description / ja | description / ja | ||
| + | 先端RI(ARIM)装置分類 | ||
| Property / has broader | |||
| + | |||
| Property / has broader: Analysis / rank | |||
| + | Normal rank | ||
| Property / part of dictionary | |||
| + | |||
| Property / part of dictionary: ARIM Instrument Dictionary / rank | |||
| + | Normal rank | ||
| Property / similar to item | |||
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| Property / similar to item: Electronic Materials & Device characterization / rank | |||
| + | Normal rank | ||
Latest revision as of 00:26, 28 April 2022
ARIM instrument classification
| Language | Label | Description | Also known as |
|---|---|---|---|
| English |
Electronic Materials & Device characterization
|
ARIM instrument classification
|