Difference between revisions of "Atomic Force Microscope (Q1950)"
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(Changed an Item: Item created by hirosawa) |
(Created claim: similar to item (P40): Atomic Force Microscope (Q2138)) |
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| (7 intermediate revisions by 2 users not shown) | |||
| aliases / en / 0 | aliases / en / 0 | ||
| + | AFM | ||
| aliases / ja / 0 | aliases / ja / 0 | ||
| + | AFM | ||
| description / en | description / en | ||
| + | ARIM instrument classification | ||
| description / ja | description / ja | ||
| + | 先端RI(ARIM)装置分類 | ||
| Property / has broader | |||
| + | |||
| Property / has broader: Scanning Probe Microscope / rank | |||
| + | Normal rank | ||
| Property / part of dictionary | |||
| + | |||
| Property / part of dictionary: ARIM Instrument Dictionary / rank | |||
| + | Normal rank | ||
| Property / similar to item | |||
| + | |||
| Property / similar to item: Atomic Force Microscope / rank | |||
| + | Normal rank | ||
Latest revision as of 00:25, 28 April 2022
ARIM instrument classification
- AFM
| Language | Label | Description | Also known as |
|---|---|---|---|
| English |
Atomic Force Microscope
|
ARIM instrument classification
|
|