scanning Auger electron microscopy (Q38): Difference between revisions

Latest revision as of 02:23, 25 July 2024

No description defined

Language	Label	Description	Also known as
English	scanning Auger electron microscopy	No description defined	scanning Auger microscopy

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@@ label / ja / label / ja @@
+走査型オージェ電子顕微鏡法
@@ aliases / en / 0 / aliases / en / 0 @@
+scanning Auger microscopy
@@ Property / has broader: microscopy / reference @@
+imported from: DICE Materials Data Vocabulary
@@ Property / has broader @@
+spectroscopy
@@ Property / has broader: spectroscopy / rank @@
+Normal rank
@@ Property / part of dictionary @@
+characterization dictionary
@@ Property / part of dictionary: characterization dictionary / rank @@
+Normal rank