analytical electron microscope (Q560): Difference between revisions
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(Changed claim: performs function (P43): analytical electron microscopy (Q334)) |
(Added [ja] label: 分析電子顕微鏡) |
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| label / ja | label / ja | ||
分析電子顕微鏡 | |||
Latest revision as of 07:38, 13 December 2019
No description defined
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | analytical electron microscope |
No description defined |