scanning Auger electron microscopy (Q38): Difference between revisions
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(Created claim: part of dictionary (P11): characterization dictionary (Q9)) |
(Added [en] alias: scanning Auger microscopy) |
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(One intermediate revision by one other user not shown) | |||
label / ja | label / ja | ||
走査型オージェ電子顕微鏡法 | |||
aliases / en / 0 | aliases / en / 0 | ||
scanning Auger microscopy |
Latest revision as of 02:23, 25 July 2024
No description defined
- scanning Auger microscopy
Language | Label | Description | Also known as |
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English | scanning Auger electron microscopy |
No description defined |
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