Difference between revisions of "scanning Auger electron microscopy (Q38)"
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(Created claim: has broader (P8): microscopy (Q37)) |
(Added [en] alias: scanning Auger microscopy) |
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| label / ja | label / ja | ||
| + | 走査型オージェ電子顕微鏡法 | ||
| aliases / en / 0 | aliases / en / 0 | ||
| + | scanning Auger microscopy | ||
| Property / has broader: microscopy / reference | |||
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| Property / has broader | |||
| + | |||
| Property / has broader: spectroscopy / rank | |||
| + | Normal rank | ||
| Property / part of dictionary | |||
| + | |||
| Property / part of dictionary: characterization dictionary / rank | |||
| + | Normal rank | ||
Latest revision as of 02:23, 25 July 2024
No description defined
- scanning Auger microscopy
| Language | Label | Description | Also known as |
|---|---|---|---|
| English |
scanning Auger electron microscopy
|
No description defined
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