Difference between revisions of "scanning Auger electron microscopy (Q38)"

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(‎Created claim: has broader (P8): microscopy (Q37))
(‎Added [en] alias: scanning Auger microscopy)
 
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label / jalabel / ja
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走査型オージェ電子顕微鏡法
aliases / en / 0aliases / en / 0
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scanning Auger microscopy
Property / has broader: microscopy / reference
 +
Property / has broader
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Property / has broader: spectroscopy / rank
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Normal rank
Property / part of dictionary
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Property / part of dictionary: characterization dictionary / rank
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Normal rank

Latest revision as of 02:23, 25 July 2024

No description defined
  • scanning Auger microscopy
Language Label Description Also known as
English
scanning Auger electron microscopy
No description defined
  • scanning Auger microscopy

Statements