Time-Of-Flight Secondary Ion Mass Spectrometry (Q1979): Difference between revisions
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(Changed an Item: Item created by hirosawa) |
(Created claim: similar to item (P40): Time-Of-Flight Secondary Ion Mass Spectrometry (Q2167)) |
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| aliases / en / 0 | aliases / en / 0 | ||
TOF-SIMS | |||
| aliases / ja / 0 | aliases / ja / 0 | ||
TOF-SIMS | |||
| description / ja | description / ja | ||
先端RI(ARIM)装置分類 | |||
| Property / has broader | |||
| Property / has broader: Mass Spectrometer / rank | |||
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| Property / part of dictionary | |||
| Property / part of dictionary: ARIM Instrument Dictionary / rank | |||
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| Property / similar to item | |||
| Property / similar to item: Time-Of-Flight Secondary Ion Mass Spectrometry / rank | |||
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Latest revision as of 00:27, 28 April 2022
ARIM instrument classification
- TOF-SIMS
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Time-Of-Flight Secondary Ion Mass Spectrometry |
ARIM instrument classification |
|