Difference between revisions of "Focused Ion Beam (Q2130)"
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(Created claim: has broader (P8): Sample Prepration (Q1924)) |
(Created claim: similar to item (P40): Focused Ion Beam (Q1944)) |
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| Property / similar to item: Focused Ion Beam / rank | |||
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Latest revision as of 05:19, 27 April 2022
DICE instrument classification
- FIB
| Language | Label | Description | Also known as |
|---|---|---|---|
| English |
Focused Ion Beam
|
DICE instrument classification
|
|