Focused Ion Beam (Q2130): Difference between revisions
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(Created a new Item: Item created by hirosawa) |
(Created claim: similar to item (P40): Focused Ion Beam (Q1944)) |
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| (7 intermediate revisions by the same user not shown) | |||
| label / ja | label / ja | ||
集束イオンビーム | |||
| aliases / en / 0 | aliases / en / 0 | ||
FIB | |||
| aliases / ja / 0 | aliases / ja / 0 | ||
FIB | |||
| description / en | description / en | ||
DICE instrument classification | |||
| description / ja | description / ja | ||
DICE装置分類 | |||
| Property / has broader | |||
| Property / has broader: Sample Prepration / rank | |||
Normal rank | |||
| Property / part of dictionary | |||
| Property / part of dictionary: DICE Instrument Dictionary / rank | |||
Normal rank | |||
| Property / similar to item | |||
| Property / similar to item: Focused Ion Beam / rank | |||
Normal rank | |||
Latest revision as of 05:19, 27 April 2022
DICE instrument classification
- FIB
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Focused Ion Beam |
DICE instrument classification |
|