Difference between revisions of "Electronic Materials & Device characterization (Q2208)"
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(Created a new Item: Item created by hirosawa) |
(Created claim: similar to item (P40): Electronic Materials & Device characterization (Q2020)) |
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| (5 intermediate revisions by the same user not shown) | |||
| label / ja | label / ja | ||
| + | 電子材料・デバイス評価 | ||
| description / en | description / en | ||
| + | DICE instrument classification | ||
| description / ja | description / ja | ||
| + | DICE装置分類 | ||
| Property / has broader | |||
| + | |||
| Property / has broader: Analysis / rank | |||
| + | Normal rank | ||
| Property / part of dictionary | |||
| + | |||
| Property / part of dictionary: DICE Instrument Dictionary / rank | |||
| + | Normal rank | ||
| Property / similar to item | |||
| + | |||
| Property / similar to item: Electronic Materials & Device characterization / rank | |||
| + | Normal rank | ||
Latest revision as of 07:15, 25 April 2022
DICE instrument classification
| Language | Label | Description | Also known as |
|---|---|---|---|
| English |
Electronic Materials & Device characterization
|
DICE instrument classification
|