Atomic Force Microscope (Q2138): Difference between revisions
Jump to navigation
Jump to search
(Created claim: has broader (P8): Scanning Probe Microscope (Q1926)) |
(Created claim: similar to item (P40): Atomic Force Microscope (Q1950)) |
||
| (One intermediate revision by the same user not shown) | |||
| Property / part of dictionary | |||
| Property / part of dictionary: DICE Instrument Dictionary / rank | |||
Normal rank | |||
| Property / similar to item | |||
| Property / similar to item: Atomic Force Microscope / rank | |||
Normal rank | |||
Latest revision as of 06:33, 6 April 2022
DICE instrument classification
- AFM
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Atomic Force Microscope |
DICE instrument classification |
|