Difference between revisions of "Atomic Force Microscope (Q2138)"
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(Changed an Item: Item created by hirosawa) |
(Created claim: similar to item (P40): Atomic Force Microscope (Q1950)) |
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| Property / has broader | |||
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| Property / has broader: Scanning Probe Microscope / rank | |||
| + | Normal rank | ||
| Property / part of dictionary | |||
| + | |||
| Property / part of dictionary: DICE Instrument Dictionary / rank | |||
| + | Normal rank | ||
| Property / similar to item | |||
| + | |||
| Property / similar to item: Atomic Force Microscope / rank | |||
| + | Normal rank | ||
Latest revision as of 06:33, 6 April 2022
DICE instrument classification
- AFM
| Language | Label | Description | Also known as |
|---|---|---|---|
| English |
Atomic Force Microscope
|
DICE instrument classification
|
|