Difference between revisions of "Atomic Force Microscope (Q2138)"
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(Created a new Item: Item created by hirosawa) |
(Created claim: similar to item (P40): Atomic Force Microscope (Q1950)) |
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(7 intermediate revisions by the same user not shown) | |||
label / ja | label / ja | ||
+ | 原子間力顕微鏡 | ||
aliases / en / 0 | aliases / en / 0 | ||
+ | AFM | ||
aliases / ja / 0 | aliases / ja / 0 | ||
+ | AFM | ||
description / en | description / en | ||
+ | DICE instrument classification | ||
description / ja | description / ja | ||
+ | DICE装置分類 | ||
Property / has broader | |||
+ | |||
Property / has broader: Scanning Probe Microscope / rank | |||
+ | Normal rank | ||
Property / part of dictionary | |||
+ | |||
Property / part of dictionary: DICE Instrument Dictionary / rank | |||
+ | Normal rank | ||
Property / similar to item | |||
+ | |||
Property / similar to item: Atomic Force Microscope / rank | |||
+ | Normal rank |
Latest revision as of 06:33, 6 April 2022
DICE instrument classification
- AFM
Language | Label | Description | Also known as |
---|---|---|---|
English |
Atomic Force Microscope
|
DICE instrument classification
|
|