Language	Label	Description	Alias
English	Film Thickness Measurement	ARIM instrument classification
Japanese	膜厚測定	先端RI(ARIM)装置分類

Language	English
Label	Film Thickness Measurement
Description	ARIM instrument classification
Alias

Language	Japanese
Label	膜厚測定
Description	先端RI(ARIM)装置分類
Alias

Semantic Relatives

Parent

Q1901: Analysis

Siblings:

• Q2006: Differential Scanning Calorimetry
• Q2007: Thermal Gravimetric Analysis
• Q2008: Thermal Gravimetric Differential Scanning Calorimetry
• Q2009: Thermomechanical Analyzer
• Q2010: Viscoelasticity
• Q2011: Profiler
• Q2013: Ellipsometry
• Q2014: Contact Angle Meter
• Q2015: Zeta Potential
• Q2016: Dynamic Light Scattering
• Q2017: Static Light Scattering
• Q2018: Vapor Pressure Osmometer
• Q2019: Electronic Property
• Q2020: Electronic Materials & Device characterization
• Q2021: Mössbauer Spectrometer