Q376: secondary ion mass spectrometry
Vocabulary ID
http://matvoc.nims.go.jp/entity/Q376
Language | Label | Description | Alias |
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English | secondary ion mass spectrometry | - | - |
Japanese | 二次イオン質量分析法 | - | - |
Language | English |
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Label | secondary ion mass spectrometry |
Description | |
Alias |
Language | Japanese |
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Label | 二次イオン質量分析法 |
Description | |
Alias |