Q349: ellipsometry
Vocabulary ID
http://matvoc.nims.go.jp/entity/Q349
| Language | Label | Description | Alias |
|---|---|---|---|
| English | ellipsometry | - | - |
| Japanese | エリプソメトリー | - | - |
| Language | English |
|---|---|
| Label | ellipsometry |
| Description | |
| Alias |
| Language | Japanese |
|---|---|
| Label | エリプソメトリー |
| Description | |
| Alias |
Semantic Relatives
Parents
Q278: optical property
Siblings:- Q279: index of refraction
- Q280: luminescence
- Q281: photoconductivity
- Q347: differential refractive index
- Q348: dynamic light scattering
- Q350: fractography
- Q351: light scattering
- Q352: quasi-elastic light scattering
- Q3262: reflection
- Q3263: absorbance
- Q3264: transmittance
- Q3265: polarization
- Q3266: diffraction
- Q3267: interference
- Q3268: radiation
- Q3269: color
- Q3270: excitation
- Q3271: laser
- Q3272: wave guide
- Q3273: nonlinear optical properties
- Q3274: magneto-optical effect
- Q3275: fluorescence
- Q3276: phosphorescence
- Q3277: luminescence
- Q3278: other optical properties